Intermolecular and Surface Forces

Secondary Ion Mass Spectrometry: Applications for Depth Profiling and Surface Characterization, Paperback - Fred Stevie imagine

Secondary Ion Mass Spectrometry: Applications for Depth Profiling and Surface Characterization, Paperback - Fred Stevie

592,99 RON 634,99 RON
Reducere. DescriptionThis book was written to explain a technique that requires an understanding of many details in order to properly obtain and interpret th...
momentum press, carti, carte straina, mathematics & science, science: general issues
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