Wafer-Level Testing and Test During Burn-In for Integrated Circuits. Unabridged ed, Hardback - Krishnendu Chakrabarty
870,99 RON
Publisher: Artech House PublishersAuthor(s): Krishnendu ChakrabartyNumber of pages: 210Publication date: 2010Dimensions: 164 x 235 x 18Cover type: ...
elefant.ro